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|Type:||Artigo de periódico|
|Title:||Acid-Base Site Detection and Mapping on Solid Surfaces by Kelvin Force Microscopy (KFM)|
|Abstract:||Electrostatic potential at the surface of acidic or basic solids changes under higher relative humidity (RH), as determined by using Kelvin force microscopy (KFM). The potential on acid surfaces becomes more negative as the water vapor pressure increases, while it becomes more positive on basic solids. These results verify the following hypothesis: OH- or H+ ions associated with atmospheric water ion clusters are selectively adsorbed on solid surfaces, depending on the respective Bronsted acid or base character. Therefore, Kelvin microscopy, under variable humidity, is a rigorous but convenient alternative to determine the acid-base character of solid surfaces, with a great advantage: it uses only one amphoteric and simple reagent to determine both the acid and base sites. Moreover, this technique provides information on the spatial distribution of acid-base sites, which is currently inaccessible to any other method.|
|Editor:||Amer Chemical Soc|
|Citation:||Analytical Chemistry. Amer Chemical Soc, v. 84, n. 23, n. 10191, n. 10198, 2012.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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