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Type: Artigo de periódico
Title: Accelerated life tests analyzed by a piecewise exponential distribution via generalized linear models
Author: Barbosa, EP
Colosimo, EA
LouzadaNeto, F
Abstract: Efficient industrial experiments for reliability analysis of manufactured products consist of subjecting the units to accelerated life tests, where for each pre-fixed stress level, the experiment ends after the failure of a certain prefixed proportion of units or a certain test time is reached. This paper estimates the mean life of the units under usual working conditions, based on censored data obtained from units under stress conditions. This problem is approached through a generalized linear model and related inferential techniques, considering the very flexible class of failure distributions, piecewise exponential model, and a log-linear stress-response relationship. The general framework has as particular cases, among others, the power law model, the Arrhenius model, and the generalized Eyring model. A numerical example illustrates the methodology.
Subject: accelerated life test
generalized linear model
mean life
stress-response relation (SRR)
piecewise exponential distribution
generalized linear interactive modeling (GLIM) system
Editor: Ieee-inst Electrical Electronics Engineers Inc
Rights: fechado
Identifier DOI: 10.1109/24.556584
Date Issue: 1996
Appears in Collections:Artigos e Materiais de Revistas Científicas - Unicamp

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