Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/53406
Type: Artigo de periódico
Title: Measurement of refractive index of GaSb (1.8 to 2.56 mu m) using a prism
Author: Uribe, MM
deOliveira, CEM
Clerice, JH
Miranda, RS
Zakia, MB
deCarvalho, MMG
Patel, NB
Abstract: The authors have measured the refractive index of GaSb for the transparent region from 1.8 to 2.56 mu m using refraction in a prism. The values obtained agree well. with those recently measured by the authors using ellipsometry. A good fit to the experimental data is obtained using the single oscillator model.
Subject: refractive index
refractive index measurement
semiconductor devices
Country: Inglaterra
Editor: Iee-inst Elec Eng
Rights: fechado
Date Issue: 1996
Appears in Collections:Artigos e Materiais de Revistas Científicas - Unicamp

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