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|Type:||Artigo de periódico|
|Title:||A comparison between Geant4 PIXE simulations and experimental data for standard reference samples|
El Bast, M
El Haddad, R
El Bitar, Z
|Abstract:||The Geant4 PIXE de-excitation processes are used to simulate proton beam interactions with sample materials of known composition. Simulations involve four mono-elemental materials; Cu, Fe, Si and Al and three relatively complex materials: stainless steel, phosphor bronze and basal BE-N reference material composed of 25 different elements. The simulation results are compared to experimental spectra acquired for real samples analyzed using 3 MeV incident protons delivered by an ion tandem accelerator. Data acquisition was performed using a Si(Li) detector and an aluminum funny filter was added for the three last mentioned samples depending on the configuration to reduce the noise and obtain clear resulting spectrum. The results show a good agreement between simulations and measurements for the different samples. (C) 2013 Elsevier B.V. All rights reserved.|
|Editor:||Elsevier Science Bv|
|Appears in Collections:||Artigos e Materiais de Revistas Científicas - Unicamp|
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