On the generation of white samples in severe fading conditions

Abstract

The aim of this letter is three-fold: 1) to propose a simple and efficient algorithm to generate white samples for the envelope of the kappa-mu fading model over the multipath fading clustering parameter within 0 < mu < 0.5, filling an existing gap in the generation of samples of the kappa-mu distribution; 2) to propose a simple algorithm to generate white samples for the envelope of the alpha-eta-kappa-mu fading model; and 3) to propose a simple and near 100% efficient algorithm to generate kappa-mu Extreme white samples. The algorithms make use of the acceptance-rejection method. The goodness-of-fit is objectively measured via the Kolmogorov-Smirnov test. An application example is given in order to illustrate the use of the algorithms