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Type: Artigo
Title: On the generation of white samples in severe fading conditions
Author: Renno, Vanessa M.
de Souza, Rausley A. A.
Yacoub, Michel Daoud
Abstract: The aim of this letter is three-fold: 1) to propose a simple and efficient algorithm to generate white samples for the envelope of the kappa-mu fading model over the multipath fading clustering parameter within 0 < mu < 0.5, filling an existing gap in the generation of samples of the kappa-mu distribution; 2) to propose a simple algorithm to generate white samples for the envelope of the alpha-eta-kappa-mu fading model; and 3) to propose a simple and near 100% efficient algorithm to generate kappa-mu Extreme white samples. The algorithms make use of the acceptance-rejection method. The goodness-of-fit is objectively measured via the Kolmogorov-Smirnov test. An application example is given in order to illustrate the use of the algorithms
Subject: Geradores de números aleatórios
Country: Estados Unidos
Editor: Institute of Electrical and Electronics Engineers
Rights: Fechado
Identifier DOI: 10.1109/LCOMM.2018.2879928
Date Issue: 2019
Appears in Collections:FEEC - Artigos e Outros Documentos

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