Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/341062
Type: Artigo
Title: Structural analysis of ligand-protected smaller metallic nanocrystals by atomic pair distribution function under precession electron diffraction
Author: Hoque, M. M.
Vergara, S.
Das, P. P.
Ugarte, D.
Santiago, U.
Kumara, C.
Whetten, R. L.
Dass, A.
Ponce, A.
Abstract: Atomic pair distribution function (PDF) analysis has been widely used to investigate nanocrystalline and structurally disordered materials. Experimental PDFs retrieved from electron diffraction (ePDF) in transmission electron microscopy (TEM) represent an attractive alternative to traditional PDF obtained from synchrotron X-ray sources, particularly for studying minute samples. Nonetheless, the inelastic scattering produced by the large dynamical effects of electron diffraction may obscure the interpretation of ePDF. In the present work, precession electron diffraction (PED-TEM) has been employed to obtain the ePDF of two different samples-lipoic acid- and hexanethiolate-capped gold nanoparticles (similar to 4.5 and 4.2 nm, respectively) randomly oriented and measured at both liquid nitrogen and room temperatures. The electron diffraction data were processed to obtain ePDFs which were subsequently compared with the PDF of different ideal structure models. The results demonstrate that the PED-ePDF data are sensitive to different crystalline structures such as monocrystalline (truncated octahedra) and multiply twinned (decahedra, icosahedra) structures. The results indicate that PED reduces the residual from 46 to 29%; in addition, the combination of PED and low temperature further reduced the residual to 23%, which is comparable to X-ray PDF analysis. Furthermore, the inclusion of PED resulted in a better estimation of the coordination number from ePDF. To the best of our knowledge, the precessed electron-beam technique (PED) has not been previously applied to nanoparticles for analysis by the ePDF method.
Subject: Filmes finos
Espectrometria de massa
Espalhamento (Física)
Thin films
Mass spectrometry
Scattering (Physics)
Country: Estados Unidos
Editor: American Chemical Society
Rights: fechado
Identifier DOI: 10.1021/acs.jpcc.9b02901
Address: https://pubs.acs.org/doi/10.1021/acs.jpcc.9b02901
Date Issue: 2019
Appears in Collections:IFGW - Artigos e Outros Documentos

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