Please use this identifier to cite or link to this item:
Type: Artigo
Title: Scanning tunneling measurements in membrane-based nanostructures: spatially-resolved quantum state analysis in postprocessed epitaxial systems for optoelectronic applications
Author: Rosa, B. L. T.
Parra-Murillo, C. A.
Chagas, T.
Garcia, A. J.
Guimaraes, P. S. S.
Deneke, C.
Magalhaes-Paniago, R.
Malachias, A.
Abstract: Nanoscale heterostructure engineering is the main target for the development of optoelectronic devices. In this sense, a precise knowledge of local electronic response after materials processing is required to envisage technological applications. A number of local probe techniques that address single nanostructure signals were satisfactorily employed in semiconductor epitaxial systems. In this work we show that the use of chemically etched semiconductor nanomembranes allows carrying out scanning tunneling spectroscopy (STS) measurements in a postprocessed system which was otherwise studied mainly under in situ conditions that differ from the operational regime. We were able to acquire STS spectra with energy level resolved response on InAs quantum dots grown within a 15 nm-thick GaAs single-crystalline film transferred to an Au(111) surface. The presence of a native oxide layer does not affect the result, keeping the reliability of the usual ultra high vacuum (UHV) procedures. The use of nanomembranes also opens up the possibility of tailoring properties via additional variables such as nanomembrane thickness and surface charge depletion. Our method is applicable to a broad class of postprocessed layers extracted in nanomembrane format from epitaxial systems that are potential candidates for optoelectronic applications.
Subject: Microscopia de tunelamento de elétrons
Pontos quânticos
Scanning tunneling microscopy
Quantum dots
Country: Estados Unidos
Editor: American Chemical Society
Rights: fechado
Identifier DOI: 10.1021/acsanm.9b01124
Date Issue: 2019
Appears in Collections:IFGW - Artigos e Outros Documentos

Files in This Item:
File SizeFormat 
000477917700068.pdf2.79 MBAdobe PDFView/Open

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.