Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/329241
Type: Artigo
Title: D-mbtdd: An Approach For Reusing Test Artefacts In Evolving Systems
D-MBTDD : an approach for reusing test artefacts in evolving systems
Author: Ussami, Thais Harumi
Martins, Eliane
Montecchi, Leonardo
Abstract: Agile software development methodologies use an iterative and incremental development in order to handle evolving systems. Consolidated techniques in the field of testing have been applied to these techniques with the main purpose of aiding in the test creation stage. An example is Model-Based Test Driven Development (MBTDD) which joins the concepts of Model-Based Testing (MBT) and Test Driven Development (TDD). However, when iterative and incremental processes are used, problems appear as the consequence of the evolution of the system, such as: how to reuse the test artefacts, and how to select the relevant tests for implementing the new version of the system. In this context, this work proposes a process called D-MBTDD in which the agile development of a system is guided by model-based tests, focusing on helping with the reuse of test artefacts and on the process of identifying tests relevant to development. The information about the modifications between two versions of the test model are used in this approach, which was compared to the Regenerate-All approach, which regenerates test cases along the iterations and does not reuse any of them.
Agile software development methodologies use an iterative and incremental development in order to handle evolving systems. Consolidated techniques in the field of testing have been applied to these techniques with the main purpose of aiding in the test cr
Subject: Model-based Test Driven Development
Evolving System
Agile Development
Incremental Tests
Test Reuse
Model-based Regression Tests
Desenvolvimento ágil de software
Software - Testes
Programação (Computadores)
Testes de regressão
Country: Estados Unidos
Editor: Institute of Electrical and Electronics Engineers
Citation: 2016 46th Annual Ieee/ifip International Conference On Dependable Systems And Networks Workshops (dsn-w). Ieee, p. 39 - 46, 2016.
Rights: fechado
fechado
Identifier DOI: 10.1109/DSN-W.2016.22
Address: http://ieeexplore.ieee.org/abstract/document/7575347/
Date Issue: 2016
Appears in Collections:IC - Artigos e Outros Documentos

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