Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/326421
Type: Artigo
Title: Ni 3d - O 2p Hybridization Dependent Magnetic Properties Of Lanio3 Thin Films
Ni 3d - O 2p hybridization dependent magnetic properties of LaNiO3 thin films
Author: Kumar, Y.
Singh, A. P.
Sharma, S. K.
Choudhary, R. J.
Thakur, P.
Knobel, M.
Brookes, N. B.
Kumar, R.
Abstract: We present here the study on magnetic properties and their relation to the electronic structure for c-axis oriented LaNiO3 films deposited on LaAlO3 single crystals using the rf-magnetron sputtering. Swift heavy ion irradiation induced annealing alters the unusual temperature dependent magnetic behaviour of pristine film to the paramagnetic one. X-ray absorption spectroscopic measurements, performed at O K-edge and Ni L-edge, reveal that Ni-O hybridization is increased after the initial irradiation. Charge-transfer multiplet calculations of the Ni L-edge indicate that variation of magnetic behaviour can be related to the Ni-O hybridization strength inducing a further variation in Ni spin state. (C) 2016 Published by Elsevier B.V.
We present here the study on magnetic properties and their relation to the electronic structure for c-axis oriented LaNiO3 films deposited on LaAlO3 single crystals using the rf-magnetron sputtering. Swift heavy ion irradiation induced annealing alters the unusual temperature dependent magnetic behaviour of pristine film to the paramagnetic one. X-ray absorption spectroscopic measurements, performed at O K-edge and Ni L-edge, reveal that Ni-O hybridization is increased after the initial irradiation. Charge-transfer multiplet calculations of the Ni L-edge indicate that variation of magnetic behaviour can be related to the Ni-O hybridization strength inducing a further variation in Ni spin state.
Subject: Hybridization
X-ray Absorption Spectroscopy
Spin-state
Magnetization
Swift Heavy Ion Irradiation
Hibridização, Absorção de raios X próximo a estrutura da borda, Magnetização
Country: Holanda
Editor: Elsevier
Citation: Thin Solid Films. Elsevier Science Sa, v. 619, p. 144 - 147, 2016.
Rights: fechado
Identifier DOI: 10.1016/j.tsf.2016.11.008
Address: https://www.sciencedirect.com/science/article/pii/S0040609016306939
Date Issue: 2016
Appears in Collections:IFGW - Artigos e Outros Documentos

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