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|Type:||Artigo de Periódico|
|Title:||Surface Structure Determination Of Black Phosphorus Using Photoelectron Diffraction|
R; de Siervo
|Abstract:||The atomic structure of single-crystalline black phosphorus is studied using high-resolution synchrotron-based photoelectron diffraction (XPD). The results show that the topmost phosphorene layer in the black phosphorus is slightly displaced compared to the bulk structure and presents a small contraction in the direction perpendicular to the surface. Furthermore, the XPD results show the presence of a small buckling among the surface atoms, in agreement with previously reported scanning tunneling microscopy results. The contraction of the surface layer added to the presence of the buckling indicates a uniformity in the size of the sp(3) bonds between P atoms at the surface.|
|Editor:||AMER PHYSICAL SOC|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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