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Type: Artigo de periódico
Title: Delocalized states in damaged DNA
Author: Caetano, R. A.
Schulz, P. A.
Abstract: Recent studies suggest that base pairing is an efficient electronic delocalization mechanism. However, defects may break down such effect. In the present work we show how a simple model of defects suppresses the delocalization, which survives only for low defect concentrations.
Subject: Damaged DNA
Tight binding model
Editor: Sociedade Brasileira de Física
Rights: aberto
Identifier DOI: 10.1590/S0103-97332006000300061
Date Issue: 1-Jun-2006
Appears in Collections:Artigos e Materiais de Revistas Científicas - Unicamp

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