Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/243971
Type: Artigo
Title: Use of specklegrams background terms for speckle photography combined with phase-shifting electronic speckle pattern interferometry
Author: Zemmamouche, Redouane
Vandenrijt, Jean-François
Medjahed, Aïcha
Oliveira, Ivan de
Georges, Marc P.
Abstract: Electronic speckle pattern interferometry (ESPI) is combined with digital speckle photography (DSP) to measure out-of-plane deformation in the presence of large in-plane translation or rotation. ESPI is used to measure out-of-plane displacements smaller than the speckle diameter. In-plane displacements larger than the speckle size are obtained by DSP using artifacts images computed from the phase-stepped specklegrams. Previous works use the specklegram modulation for that purpose, but we show that this can lead to errors in the case of low modulation. In order to avoid this, a simple averaging of phase-stepped specklegrams allows obtaining the average irradiance, which contains information on the speckled object image. The latter can be used more efficiently than the modulation in DSP and is simpler to compute. We also perform a numerical simulation of specklegrams, which show that the use of background terms is much more stable against some error sources as compared to modulation. We show experimental evidence of this in various experiments combining out-of-plane ESPI measurements with in-plane translations or rotations obtained by our DSP method. The latter has been used efficiently to restore phase loss in out-of-plane ESPI measurements due to large in-plane displacements. (C) 2015 Society of Photo-Optical Instrumentation Engineers (SPIE)
Electronic speckle pattern interferometry (ESPI) is combined with digital speckle photography (DSP) to measure out-of-plane deformation in the presence of large in-plane translation or rotation. ESPI is used to measure out-of-plane displacements smaller t
Subject: Fotografia - Técnicas digitais
Processamento de sinais
Speckle
Country: Estados Unidos
Editor: SPIE - International Society for Optical Engineering
Citation: Use Of Specklegrams Background Terms For Speckle Photography Combined With Phase-shifting Electronic Speckle Pattern Interferometry. Spie-soc Photo-optical Instrumentation Engineers, v. 54, p. AUG-2015.
Rights: aberto
Fechado
Identifier DOI: 10.1117/1.OE.54.8.084110
Address: https://www.spiedigitallibrary.org/journals/optical-engineering/volume-54/issue-08/084110/Use-of-specklegrams-background-terms-for-speckle-photography-combined-with/10.1117/1.OE.54.8.084110.full
Date Issue: 2015
Appears in Collections:FT - Artigos e Outros Documentos

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