Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/242989
Type: Artigo de periódico
Title: Grazing-incidence Xrf Analysis Of Layered Samples: Detailed Study Of Amplitude Calculation
Author: Miqueles
Eduardo X.; Perez
Carlos A.; Suarez
Vanessa I.; Vescovi
Rafael F. C.
Abstract: In this article, we propose a new mathematical approach for the computation of electromagnetic wave amplitudes in grazing incidence X-ray fluorescence (GIXRF)-an analytical method for surface and near-surface layer analysis. The new contribution comes from an applied point of view, in order to have stable and fast algorithms to simulate the fluorescence intensity from a stacking of thin layer films. The calculation of transmitted/reflected amplitudes is an important part of the direct and/or inverse problem. An analysis of the amplitude versus layer thickness is also given. (C) 2015 Elsevier B.V. All rights reserved.
Subject: X-ray-fluorescence
Surface-analysis
Inversion
Country: AMSTERDAM
Editor: ELSEVIER SCIENCE BV
Rights: embargo
Identifier DOI: 10.1016/j.cpc.2015.03.025
Address: http://www.sciencedirect.com/science/article/pii/S001046551500140X
Date Issue: 2015
Appears in Collections:Unicamp - Artigos e Outros Documentos

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