Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/242989
Type: Artigo
Title: Grazing-incidence XRF analysis of layered samples: detailed study of amplitude calculation
Author: Miqueles, E. X.
Pérez, C. A.
Suárez, V. I.
Vescovi, R. F. C.
Abstract: In this article, we propose a new mathematical approach for the computation of electromagnetic wave amplitudes in grazing incidence X-ray fluorescence (GIXRF)-an analytical method for surface and near-surface layer analysis. The new contribution comes from an applied point of view, in order to have stable and fast algorithms to simulate the fluorescence intensity from a stacking of thin layer films. The calculation of transmitted/reflected amplitudes is an important part of the direct and/or inverse problem. An analysis of the amplitude versus layer thickness is also given. (C) 2015 Elsevier B.V. All rights reserved.
In this article, we propose a new mathematical approach for the computation of electromagnetic wave amplitudes in grazing incidence X-ray fluorescence (GIXRF)-an analytical method for surface and near-surface layer analysis. The new contribution comes from an applied point of view, in order to have stable and fast algorithms to simulate the fluorescence intensity from a stacking of thin layer films. The calculation of transmitted/reflected amplitudes is an important part of the direct and/or inverse problem. An analysis of the amplitude versus layer thickness is also given.
Subject: Síncrotron
Algoritmos
Fluorescência
Country: Holanda
Editor: Elsevier
Citation: Grazing-incidence Xrf Analysis Of Layered Samples: Detailed Study Of Amplitude Calculation. Elsevier Science Bv, v. 194, p. 33-42 SEP-2015.
Rights: fechado
Identifier DOI: 10.1016/j.cpc.2015.03.025
Address: https://www.sciencedirect.com/science/article/pii/S001046551500140X
Date Issue: 2015
Appears in Collections:IFGW - Artigos e Outros Documentos

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