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dc.contributor.CRUESPUNIVERSIDADE ESTADUAL DE CAMPINASpt_BR
dc.contributor.authorunicampSiervo, Abner dept_BR
dc.contributor.authorunicampLanders, Richardpt_BR
dc.typeArtigopt_BR
dc.titleSurface structure characterization of ultra-thin films of Au deposited on Pd(111)pt_BR
dc.contributor.authorPancotti, A.pt_BR
dc.contributor.authorSiervo, A. dept_BR
dc.contributor.authorNascente, P. A. P.pt_BR
dc.contributor.authorLanders, R.pt_BR
dc.subjectLigas de ouropt_BR
dc.subjectPaládiopt_BR
dc.subjectEspectroscopia fotoeletrônica de raio Xpt_BR
dc.subjectRadiação sincrotrônicapt_BR
dc.subjectDifração eletrônica em baixa energiapt_BR
dc.subject.otherlanguageGold alloyspt_BR
dc.subject.otherlanguagePalladiumpt_BR
dc.subject.otherlanguageX-ray photoelectron spectroscopypt_BR
dc.subject.otherlanguageSynchrotron radiationpt_BR
dc.subject.otherlanguageLow energy electron diffractionpt_BR
dc.description.abstractUltra-thin films of Au were deposited on the Pd(111) surface and then characterized by X-ray photoelectron spectroscopy (XPS), low-energy electron diffraction (LEED), and X-ray photoelectron diffraction (XPD) generated by synchrotron radiation. The Au films were deposited at room temperature (300. K) and subsequently annealed at 400. °C (673. K) and 610. °C (883. K). XPD analyses indicated that the gold films were 7 and 6 ML thick, for the annealing temperatures of 400. °C and 610. °C, respectively. The film interlayer distances exhibited an oscillatory behavior, with a 5% contraction between the top and the second layers, a 3% expansion between the second and the third layers, for the film annealed at 400. °C, and a 2% expansion in the interlayer distance between the top and the second layers and a 4% contraction between the second and the third layers, for the film annealed at 610. °C. For both annealing temperatures, the interlayer distances between the third and the fourth layers and between the fourth and the fifth layers exhibited a 1% expansion and a 2% contraction. For the film annealed at 610. °C, XPD results revealed that the Pd(111) surface was covered by Au islands, with some bare patches exposed. © 2015 Elsevier B.V.en
dc.description.abstractUltra-thin films of Au were deposited on the Pd(111) surface and then characterized by X-ray photoelectron spectroscopy (XPS), low-energy electron diffraction (LEED), and X-ray photoelectron diffraction (XPD) generated by synchrotron radiation. The Au films were deposited at room temperature (300 K) and subsequently annealed at 400 °C (673 K) and 610 °C (883 K). XPD analyses indicated that the gold films were 7 and 6 ML thick, for the annealing temperatures of 400 °C and 610 °C, respectively. The film interlayer distances exhibited an oscillatory behavior, with a 5% contraction between the top and the second layers, a 3% expansion between the second and the third layers, for the film annealed at 400 °C, and a 2% expansion in the interlayer distance between the top and the second layers and a 4% contraction between the second and the third layers, for the film annealed at 610 °C. For both annealing temperatures, the interlayer distances between the third and the fourth layers and between the fourth and the fifth layers exhibited a 1% expansion and a 2% contraction. For the film annealed at 610 °C, XPD results revealed that the Pd(111) surface was covered by Au islands, with some bare patches exposed.pt
dc.description.abstractUltra-thin films of Au were deposited on the Pd(111) surface and then characterized by X-ray photoelectron spectroscopy (XPS), low-energy electron diffraction (LEED), and X-ray photoelectron diffraction (XPD) generated by synchrotron radiation. The Au films were deposited at room temperature (300 K) and subsequently annealed at 400 °C (673 K) and 610 °C (883 K). XPD analyses indicated that the gold films were 7 and 6 ML thick, for the annealing temperatures of 400 °C and 610 °C, respectively. The film interlayer distances exhibited an oscillatory behavior, with a 5% contraction between the top and the second layers, a 3% expansion between the second and the third layers, for the film annealed at 400 °C, and a 2% expansion in the interlayer distance between the top and the second layers and a 4% contraction between the second and the third layers, for the film annealed at 610 °C. For both annealing temperatures, the interlayer distances between the third and the fourth layers and between the fourth and the fifth layers exhibited a 1% expansion and a 2% contraction. For the film annealed at 610 °C, XPD results revealed that the Pd(111) surface was covered by Au islands, with some bare patches exposed.pt_BR
dc.relation.ispartofSurface sciencept_BR
dc.relation.ispartofabbreviationSurf. sci.pt_BR
dc.publisher.cityAmsterdampt_BR
dc.publisher.countryHolandapt_BR
dc.publisherElsevierpt_BR
dc.date.issued2016pt_BR
dc.date.monthofcirculationJunept_BR
dc.identifier.citationSurface Science. Elsevier, v. 648, p. 250 - 255, 2016.pt_BR
dc.language.isoengpt_BR
dc.description.volume648pt_BR
dc.description.firstpage250pt_BR
dc.description.lastpage255pt_BR
dc.rightsfechadopt_BR
dc.sourceSCOPUSpt_BR
dc.identifier.issn0039-6028pt_BR
dc.identifier.eissn1879-2758pt_BR
dc.identifier.doi10.1016/j.susc.2015.11.008pt_BR
dc.identifier.urlhttps://www.sciencedirect.com/science/article/pii/S0039602815003805pt_BR
dc.description.sponsorshipFAPESP - FUNDAÇÃO DE AMPARO À PESQUISA DO ESTADO DE SÃO PAULOpt_BR
dc.description.sponsorshipCNPQ - CONSELHO NACIONAL DE DESENVOLVIMENTO CIENTÍFICO E TECNOLÓGICOpt_BR
dc.description.sponsorship1FAPESP - FUNDAÇÃO DE AMPARO À PESQUISA DO ESTADO DE SÃO PAULOpt_BR
dc.description.sponsorship1CNPQ - CONSELHO NACIONAL DE DESENVOLVIMENTO CIENTÍFICO E TECNOLÓGICOpt_BR
dc.description.sponsordocumentnumber2007/54829-5pt_BR
dc.description.sponsordocumentnumberSem informaçãopt_BR
dc.date.available2016-06-03T20:15:39Z-
dc.date.accessioned2016-06-03T20:15:39Z-
dc.description.provenanceMade available in DSpace on 2016-06-03T20:15:39Z (GMT). No. of bitstreams: 1 2-s2.0-84949460142.pdf: 1182368 bytes, checksum: 86a5b283f46ec356832bef9b75331487 (MD5) Previous issue date: 2016 Bitstreams deleted on 2020-07-03T19:06:40Z: 2-s2.0-84949460142.pdf,. Added 1 bitstream(s) on 2020-07-03T19:12:33Z : No. of bitstreams: 1 2-s2.0-84959330337.pdf: 1253678 bytes, checksum: 770b12f597b68bb65a24f9521c40db18 (MD5)en
dc.identifier.urihttp://repositorio.unicamp.br/jspui/handle/REPOSIP/238464-
dc.contributor.departmentDepartamento de Física Aplicadapt_BR
dc.contributor.departmentDepartamento de Física Aplicadapt_BR
dc.contributor.unidadeInstituto de Física Gleb Wataghinpt_BR
dc.contributor.unidadeInstituto de Física Gleb Wataghinpt_BR
dc.subject.keywordBimetallic surfacespt_BR
dc.subject.keywordSurface alloyspt_BR
dc.identifier.source2-s2.0-84959330337pt_BR
dc.creator.orcidorcid.org/0000-0002-7192-4740pt_BR
dc.creator.orcidorcid.org/0000-0001-9205-1822pt_BR
dc.type.formArtigopt_BR
dc.type.formArtigopt_BR
dc.description.sponsorNoteThis work was supported by FAPESP (process 2007/54829-5), CNPq, and CNPEM/LNLS (SXS project no. 7074).pt_BR
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