Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/238464
Type: Artigo
Title: Surface structure characterization of ultra-thin films of Au deposited on Pd(111)
Author: Pancotti, A.
Siervo, A. de
Nascente, P. A. P.
Landers, R.
Abstract: Ultra-thin films of Au were deposited on the Pd(111) surface and then characterized by X-ray photoelectron spectroscopy (XPS), low-energy electron diffraction (LEED), and X-ray photoelectron diffraction (XPD) generated by synchrotron radiation. The Au films were deposited at room temperature (300. K) and subsequently annealed at 400. °C (673. K) and 610. °C (883. K). XPD analyses indicated that the gold films were 7 and 6 ML thick, for the annealing temperatures of 400. °C and 610. °C, respectively. The film interlayer distances exhibited an oscillatory behavior, with a 5% contraction between the top and the second layers, a 3% expansion between the second and the third layers, for the film annealed at 400. °C, and a 2% expansion in the interlayer distance between the top and the second layers and a 4% contraction between the second and the third layers, for the film annealed at 610. °C. For both annealing temperatures, the interlayer distances between the third and the fourth layers and between the fourth and the fifth layers exhibited a 1% expansion and a 2% contraction. For the film annealed at 610. °C, XPD results revealed that the Pd(111) surface was covered by Au islands, with some bare patches exposed. © 2015 Elsevier B.V.
Ultra-thin films of Au were deposited on the Pd(111) surface and then characterized by X-ray photoelectron spectroscopy (XPS), low-energy electron diffraction (LEED), and X-ray photoelectron diffraction (XPD) generated by synchrotron radiation. The Au films were deposited at room temperature (300 K) and subsequently annealed at 400 °C (673 K) and 610 °C (883 K). XPD analyses indicated that the gold films were 7 and 6 ML thick, for the annealing temperatures of 400 °C and 610 °C, respectively. The film interlayer distances exhibited an oscillatory behavior, with a 5% contraction between the top and the second layers, a 3% expansion between the second and the third layers, for the film annealed at 400 °C, and a 2% expansion in the interlayer distance between the top and the second layers and a 4% contraction between the second and the third layers, for the film annealed at 610 °C. For both annealing temperatures, the interlayer distances between the third and the fourth layers and between the fourth and the fifth layers exhibited a 1% expansion and a 2% contraction. For the film annealed at 610 °C, XPD results revealed that the Pd(111) surface was covered by Au islands, with some bare patches exposed.
Subject: Paládio
Raios X - Difração
Fotoelétrons - Difração
Radiação sincrotrônica
Country: Holanda
Editor: Elsevier
Citation: Surface Science. Elsevier, v. 648, p. 250 - 255, 2016.
Rights: fechado
Identifier DOI: 10.1016/j.susc.2015.11.008
Address: https://www.sciencedirect.com/science/article/pii/S0039602815003805
Date Issue: 2016
Appears in Collections:IFGW - Artigos e Outros Documentos

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