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|Type:||Artigo de periódico|
|Title:||Pseudoscopic Imaging In A Double Diffraction Process With A Slit: Critical Point Properties.|
|Author:||Lunazzi, José J|
Rivera, Noemí I
|Abstract:||Pseudoscopic (inverted depth) images that keep a continuous parallax were shown to be possible by use of a double diffraction process intermediated by a slit. One diffraction grating directing light to the slit acts as a wavelength encoder of views, while a second diffraction grating decodes the projected image. The process results in the enlargement of the image under common white light illumination up to infinite magnification at a critical point. We show that this point corresponds to another simple-symmetry object-observer system. Our treatment allows us to explain the experience by just dealing with main ray directions.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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