Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/105651
Type: Artigo de evento
Title: Spectral Line Profile Analysis Using Higher Diffraction Order In Vacuum Ultraviolet Region
Author: Machida M.
Daltrini A.M.
Severo J.H.F.
Nascimento I.C.
Sanada E.K.
Elizondo J.I.
Kuznetsov Y.K.
Galvao R.M.O.
Abstract: Using a one meter VUV spectrometer and a MCP coupled to a CCD detector on TCABR tokamak, ion temperatures from impurity species have been measured and much better spectral resolution was obtained using higher order diffraction lines. Due to very small Doppler effect in the VUV region compared to large instrumental broadening, ion temperatures obtained from first order diffraction present large errors. The use of second, third and fourth order diffraction emissions increases the line broadening and results in lower error temperature measurements. © 2008 American Institute of Physics.
Editor: 
Rights: aberto
Identifier DOI: 10.1063/1.2917017
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-84893458878&partnerID=40&md5=177cced3439beddee71182e88341e943
Date Issue: 2008
Appears in Collections:Unicamp - Artigos e Outros Documentos

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.