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|Type:||Artigo de periódico|
|Title:||Single- And Few-walled Carbon Nanotubes Grown At Temperatures As Low As 450°c: Electrical And Field Emission Characterization|
|Abstract:||Single-wall (SW-) and few-walled (FW-) carbon nanotubes (CNTs) were synthesized on aluminum/ cobalt coated silicon at temperatures as low as 450°C by plasma enhanced chemical vapor deposition technique (PECVD). The SWCNTs and FWCNTs grow vertically oriented and well separated from each other. The cold field emission studies of as-grown SWCNTs and FWCNTs showed low turn-on field emission threshold voltages, strongly dependent of the nanotubes morphology. Current-voltage curves of individual CNTs, measured by conductive atomic force microscopy (CAFM), showed an electrical resistance of about 90 KΩ, that is attributed mainly to the resistance of the contact between the CNTs and the conductive CAFM tip (Au and Pt). Copyright © 2007 American Scientific Publishers All rights reserved.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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