Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/104788
Type: Artigo
Title: Spectroscopy of rare gas clusters using VUV light from a free-electron-laser
Author: Castro, A. R. B. de
Bostedt, C.
Eremina, E.
Hoener, M.
Thomas, H.
Laarmann, T.
Fennel, T.
Meiwes-Broer, K.H.
Plonjes, E.
Kuhlmann, M.
Wabnitz, H.
Moller, T.
Abstract: We performed time-of-flight (TOF) spectroscopy on a jet of rare gas clusters using light pulses at λFEL = 32 nm produced by the FLASH VUV freeelectron-laser (Hamburg, Germany) with a maximum peak power density of about 3 × 1013 W/cm2 at the sample. Energy deposition on the clusters was found to be strongly dependent on lambda and much more efficient in the VUV than in the IR and visible spectral range. We observed multiple ionization of rare gas atoms coming from clusters; the latter fragment completely upon absorption of a single pulse. We have also measured high quality photoelectron spectra. Small angle soft X-ray scattering (SAXS) from a single light pulse (λFEL = 32 nm), was recorded with high signal to noise ratio for very large (Natoms 3 × 106) Argon clusters. © 2007 Elsevier B.V. All rights reserved.
We performed time-of-flight (TOF) spectroscopy on a jet of rare gas clusters using light pulses at λFEL = 32 nm produced by the FLASH VUV freeelectron-laser (Hamburg, Germany) with a maximum peak power density of about 3 × 1013 W/cm2 at the sample. Energy deposition on the clusters was found to be strongly dependent on lambda and much more efficient in the VUV than in the IR and visible spectral range. We observed multiple ionization of rare gas atoms coming from clusters; the latter fragment completely upon absorption of a single pulse. We have also measured high quality photoelectron spectra. Small angle soft X-ray scattering (SAXS) from a single light pulse (λFEL = 32 nm), was recorded with high signal to noise ratio for very large (Natoms 3 × 106) Argon clusters.
Subject: Cluster
Radiação ultravioleta
Laser de eletron livre
Raios X - Espalhamento a baixo angulo
Country: Holanda
Editor: Elsevier
Citation: Journal Of Electron Spectroscopy And Related Phenomena. , v. 156-158, n. , p. 25 - 29, 2007.
Rights: fechado
Identifier DOI: 10.1016/j.elspec.2007.01.006
Address: https://www.sciencedirect.com/science/article/pii/S0368204807000357
Date Issue: 2007
Appears in Collections:IFGW - Artigos e Outros Documentos

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