Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/104785
Type: Artigo
Title: Surface composition and structure of nickel ultra-thin films deposited on Pd(111)
Author: Carazzolle, M. F.
Maluf, S. S.
Siervo, A. de
Nascente, P. A. P.
Landers, R.
Kleiman, G. G.
Abstract: Ultra-thin nickel films deposited on the Pd(111) surface were characterized by X-ray photoelectron spectroscopy (XPS), low-energy electron diffraction (LEED), and X-ray photoelectron diffraction (XPD). Up to 3 ML coverage, a LEED (1 × 1) pattern with a diffuse background due to a random distribution of Ni atoms on the surface is observed. Annealing at 600 °C reduced the background drastically and sharp (1 × 1) spots appeared on the screen, but XPS showed no presence of nickel on the surface, indicating diffusion into the bulk. Annealing at 300 °C for 30 min yielded also a sharp (1 × 1) LEED pattern, and the XPS Ni/Pd intensity ratio decreased with annealing time. The comparison between experimental and theoretical XPD results indicated that the surface was covered partially by Ni islands and partially by a random Ni-Pd surface alloy. © 2006 Elsevier B.V. All rights reserved.
Ultra-thin nickel films deposited on the Pd(111) surface were characterized by X-ray photoelectron spectroscopy (XPS), low-energy electron diffraction (LEED), and X-ray photoelectron diffraction (XPD). Up to 3 ML coverage, a LEED (1 × 1) pattern with a diffuse background due to a random distribution of Ni atoms on the surface is observed. Annealing at 600 ?C reduced the background drastically and sharp (1 × 1) spots appeared on the screen, but XPS showed no presence of nickel on the surface, indicating diffusion into the bulk. Annealing at 300 ?C for 30 min yielded also a sharp (1 × 1) LEED pattern, and the XPS Ni/Pd intensity ratio decreased with annealing time. The comparison between experimental and theoretical XPD results indicated that the surface was covered partially by Ni islands and partially by a random Ni-Pd surface alloy.
Subject: Fotoelétrons - Difração
Raios X - Difração
Radiação sincrotrônica
Níquel
Espectroscopia de fotoelétrons por raios-X
Country: Holanda
Editor: Elsevier
Citation: Journal Of Electron Spectroscopy And Related Phenomena. , v. 156-158, n. , p. 405 - 408, 2007.
Rights: fechado
Identifier DOI: 10.1016/j.elspec.2006.11.052
Address: https://www.sciencedirect.com/science/article/pii/S0368204806001988
Date Issue: 2007
Appears in Collections:IFGW - Artigos e Outros Documentos

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