Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/104342
Type: Artigo de periódico
Title: Infrared Reflectivity Of Cox(sio2)1-x (x∼0.85, 0.55, 0.38) Granular Films On Sio2 Glass Substrates
Author: Massa N.E.
Denardin J.C.
Socolovsky L.M.
Knobel M.
de la Cruz F.P.
Zhang X.
Abstract: We report the infrared specular reflectivity of Cox(SiO2)1-x (x ∼ 0.85, 0.55, 0.38) films on SiO2 glass spanning from a metal-like to insulating behavior. While films for x ∼ 0.85 show carrier metallic shielding and hopping conductivity, for x ∼ 0.65 and lower concentrations, the nanoparticles' number and size promote a localization edge near the highest longitudinal optical frequency. Such an edge is associated with a reflectivity minimum and a higher frequency band connoting strong electron-phonon interactions, carrier phonon assisted hopping, and polaron formation. Optical conductivity fits with current polaron models provide grounds toward a microscopic understanding of transport properties in these as-prepared granular films. © 2007 Elsevier Ltd. All rights reserved.
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Rights: fechado
Identifier DOI: 10.1016/j.ssc.2006.12.019
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-33846827021&partnerID=40&md5=0f90d29443b12e67b9abacc3ff5d1841
Date Issue: 2007
Appears in Collections:Unicamp - Artigos e Outros Documentos

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