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Type: Artigo de periódico
Title: Preparation and characterization of Cd(2)Nb(2)O(7) thin films on Si substrates
Author: RONCONI, Celia M.
SUVOROVA, Nathalia
ALVES, Oswaldo L.
IRENE, Eugene A.
Abstract: Thin Cd(2)Nb(2)O(7) films were grown on single-crystal p-type SiO(2)/Si substrates by the metallo-organic decomposition (MOD) technique. The films were investigated by X-ray diffraction, X-ray energy-dispersive spectroscopy, and field emission scanning electron microscopy, and showed a single phase (cubic pyrochlore), a crack-free spherical grain structure, and nanoparticles with a mean size of about 68 nm. A Cauchy model was also used in order to obtain the thickness and index of refraction of the stack layers (transparent layer/SiO(2)/Si) by spectroscopic ellipsometry (SE). The dielectric constant (K) of the films was calculated to be about 25 from the capacitance-voltage (C-V) measurements. (c) 2008 Elsevier Ltd. All rights reserved.
Subject: Ceramics
Thin films
Dielectric properties
Country: Inglaterra
Citation: JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, v.70, n.1, p.234-237, 2009
Rights: fechado
Identifier DOI: 10.1016/j.jpcs.2008.10.006
Date Issue: 2009
Appears in Collections:IQ - Artigos e Outros Documentos

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