Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/1025
Type: Artigo de periódico
Title: Preparation and characterization of Cd(2)Nb(2)O(7) thin films on Si substrates
Author: RONCONI, Celia M.
GONCALVES, Debora
SUVOROVA, Nathalia
ALVES, Oswaldo L.
IRENE, Eugene A.
Abstract: Thin Cd(2)Nb(2)O(7) films were grown on single-crystal p-type SiO(2)/Si substrates by the metallo-organic decomposition (MOD) technique. The films were investigated by X-ray diffraction, X-ray energy-dispersive spectroscopy, and field emission scanning electron microscopy, and showed a single phase (cubic pyrochlore), a crack-free spherical grain structure, and nanoparticles with a mean size of about 68 nm. A Cauchy model was also used in order to obtain the thickness and index of refraction of the stack layers (transparent layer/SiO(2)/Si) by spectroscopic ellipsometry (SE). The dielectric constant (K) of the films was calculated to be about 25 from the capacitance-voltage (C-V) measurements. (c) 2008 Elsevier Ltd. All rights reserved.
Subject: Ceramics
Nanostructures
Oxides
Thin films
Dielectric properties
Country: Inglaterra
Editor: PERGAMON-ELSEVIER SCIENCE LTD
Citation: JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, v.70, n.1, p.234-237, 2009
Rights: fechado
Identifier DOI: 10.1016/j.jpcs.2008.10.006
Address: http://apps.isiknowledge.com/InboundService.do?Func=Frame&product=WOS&action=retrieve&SrcApp=EndNote&UT=000262558900037&Init=Yes&SrcAuth=ResearchSoft&mode=FullRecord
http://dx.doi.org/10.1016/j.jpcs.2008.10.006
Date Issue: 2009
Appears in Collections:IQ - Artigos e Outros Documentos

Files in This Item:
File Description SizeFormat 
art_RONCONI_Preparation_and_characterization_of_Cd2Nb2O7_thin_films_2009.pdfpublished version850.69 kBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.