Please use this identifier to cite or link to this item:
Type: Artigo de periódico
Title: Structural Characterization Of Hard A-c:h Films As A Function Of The Methane Pressure
Author: Lacerda R.G.
Stolojan V.
Cox D.C.
Silva S.R.P.
Marques F.C.
Abstract: Hard a-C:H films have been deposited at an industrially significant growth rate (∼0.7 nm/s), with high hardness (∼19 GPa) and relatively low stress (∼1.3 GPa). The films were obtained by the decomposition of methane in a r.f. environment at unusually conditions of high bias (∼800 V) and high pressure (∼12 Pa). The properties of the films were determined using optical transmission spectroscopy, electron energy loss spectroscopy (EELS), Raman spectroscopy, nanohardness, and stress measurements. The structural analysis indicates that the material is composed of approximately 58% sp2 sites, yet maintaining a relatively high hardness. It is thought that the sp2 sites contribute to the film hardness, together with the remaining sp3 C-C sites. The main advantage of the films reported is the very high deposition rate coupled with the relatively low stress, which enables the growth of very thick films (>2 μm) suitable for application such as protective coatings. © 2002 Elsevier Science B.V. All rights reserved.
Rights: fechado
Identifier DOI: 10.1016/S0925-9635(01)00677-X
Date Issue: 2002
Appears in Collections:Unicamp - Artigos e Outros Documentos

Files in This Item:
File Description SizeFormat 
2-s2.0-0036508331.pdf112.91 kBAdobe PDFView/Open

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.