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|Type:||Artigo de evento|
|Title:||Microstructure And Magnetic Properties Of Co Films On Si: Thickness And Roughness Dependence|
|Author:||De Carvalho H.B.|
|Abstract:||We present an investigation of the microscopic and magnetic properties of Co films with thickness ranging from 30 to 950Å deposited by magnetron sputtering onto Si (100). The film microstructure was characterized by x-ray diffraction and Atomic Force Microscopy (AFM). We have used transversal Surface Magneto-Optical Kerr Effect (SMOKE) to investigate the hysteresis loops and the in-plane switching behavior as a function of the applied magnetic field orientation. The magnetic domains characterization was carried out by longitudinal magneto-optical Kerr microscopy. The x-ray results indicate that the grains of the polycrystalline film present a hcp structure. Even though the grains seem to have a random orientation, the SMOKE results show a strong planar uniaxial anisotropy. We discuss the correlation between roughness, thickness and magnetic properties of the Co films.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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