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|Type:||Artigo de periódico|
|Title:||Confinement Versus Localization For Quantum Wells And Quantum Wires In A Self-assembled Structure|
|Abstract:||We investigate the effects of interface localization due to microroughness in a sample presenting a quantum well and a quantum wire. The magnetoshift of the emission lines measured at different temperatures are analysed using a model where the average effect of the microroughness is represented by a Gaussian defect. We obtain a quantitative estimate of the exciton localization due to the microroughness. As the temperature increases the excitons are released from the weak localized defects. Time-resolved luminescence results corroborate this interpretation. © 1999 Academic Press.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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