Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/100964
Type: Artigo de evento
Title: Limits Of Detection Of A Total Reflection X-ray Fluorescence System With Double Reflection Module
Author: Nascimento Filho V.F.
Poblete V.H.
Parreira P.S.
Matsumoto E.
Simabuco S.M.
Espinoza E.P.
Navarro A.A.
Abstract: An X-ray tube with a Mo target and Zr filter, operated at 45 kV/20 mA, was used to excite samples (5 μL deposited on a quartz support) and the total reflection angle condition was obtained with a double reflector module built with two 10-cm-long 7-mm-thick quartz crystals placed 50 μm apart. A high-resolution spectrometer based on a Si(Li) detector coupled to a multichannel analyzer was used for X-ray detection and the spectra were interpreted with the AXIL software. The system was calibrated with standard chemical solutions containing Cr, Fe, Cu, Zn, and Pb, and Y was used as an internal standard to correct eventual geometric errors and high-voltage instabilities of the X-ray generator. The limits of detection were 19, 9, 5, and 4 ng/mL for Cr, Fe, Cu, and Zn, respectively, analyzed through characteristic K(α) X-rays, and 7 ng/mL for Pb, through L(α) X-rays, considering 50 μL samples deposited and dried on a quartz support, to be excited/detected for 1000 s.
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Rights: fechado
Identifier DOI: 
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-0000120628&partnerID=40&md5=d2fd5f0899c0bf0b570de678912eb98e
Date Issue: 1999
Appears in Collections:Unicamp - Artigos e Outros Documentos

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