Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/100954
Type: Artigo de periódico
Title: Characterization Of Low-dislocation Synthetic Quartz Grown On Highly Distorted Seed By X-ray Topography
Author: Shinohara Armando H.
Iano Marcos C.
Suzuki Carlos K.
Mikawa Yutaka
Abstract: In the present study, the feasibility to grow a dislocation-free synthetic quartz with large Z-region from a seed containing high density of dislocation is reported. For such purpose, a seed with new geometric design was prepared. A seed long in Y-direction and containing V-shaped cuts with cutting angle of 90° made on Z-face {0001} was prepared and grown in the hydrothermal process. As a result, new growth regions usually not found in the conventional Y- and Z-bars synthetic quartz crystals have been imaged by the X-ray topography. The new growth region grown from the V-shaped cut was composed with two sub-regions of distinct textures. Due to their high growth velocity perpendicularly to cut faces, they disappeared and were replaced by the so-called Z-region. However, these newly grown sub-regions played an important role to change the direction of dislocation propagation present in the seed trapping them and minimizing their propagation into the grown Z-region.
Editor: IEEE, United States
Rights: fechado
Identifier DOI: 
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-0033307123&partnerID=40&md5=3962279e83cc8cb932212045e2dbe9be
Date Issue: 1999
Appears in Collections:Unicamp - Artigos e Outros Documentos

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