Browsing by Subject Fotoelétrons - Difração

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Showing results 1 to 16 of 16
PreviewIssue DateTitleAuthor(s)AdvisorType
2002Determinação estrutural de ligas metálicas de superfície via difração de fotoelétronsSiervo, Abner de, 1972-Landers, Richard, 1946-TESE
2014Determinação estrutural de grafeno sobre Irídio (111) por difração de fotoelétronsSilva, Caio César, 1988-Siervo, Abner de, 1972-DISSERTAÇÃO
2005Estudo de filmes ultra-finos de Sb/In crescidos sobre Ni (111)Carazzolle, Marcelo Falsarella, 1975-Landers, Richard, 1946-DISSERTAÇÃO
2009Determinação estrutural da superfície de óxidos ordenados por difração de fotoelétrons: o caso de CrxOy sobre Pd(111) e SrTiO3(100)Pancotti, AlexandreLanders, Richard, 1946-TESE
2018Surface characterization of NbO islands formed on Nb(100) by X-Ray photoelectron diffractionPancotti, A.; Wang, J.; Rezende, A. C. S. A.; Santos, D. P.; Siervo, A. de; Landers, R.; Nascente, P. A. P.-Artigo
2019Ultra-thin films of In on Pd(111) characterized by X-ray photoelectron diffractionPancotti, Alexandre; Siervo, Abner de; Carazzolle, Marcelo F.; Landers, Richard; Nascente, Pedro A. P.-Artigo
2001Photoemission from Pt(111)-(hex)-Rb and Pt(111)-(4x1)-RbO using polarised synchrotron radiationMorais, Jonder; Oelsner, Andreas; Schönhense, Gerd; Fecher, Gerhard H.; Landers, Richard; Siervo, Abner de; Kleiman, George G.-Artigo
2006Photoelectron spectroscopy (XPS) and photoelectron diffraction (XPD) studies on the system hafnium silicide and hafnium oxide on Si(1 0 0)Weiera, D.; Flüchtera, C.; Siervo, A. de; Schürmann, M.; Dreiner, S.; Berges, U.; Carazzolle, M. F.; Pancotti, A.; Landers, R.; Kleiman, G. G.; Westphal, C.-Artigo
2006Structure analysis of the system hafnium/silicon(100) by means of X-ray photoelectron spectroscopy and X-ray photoelectron diffraction (XPD)Flüchter, C. R.; Siervo, A. de; Weier, D.; Schürmann, M.; Berges, U.; Dreiner, S.; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.; Westphal, C.-Artigo
2007Photoelectron diffraction study and structure determination of ultrathin hafnium silicide layers on silicon(100) using Mg Kα radiation and synchrotron lightFlüchter, C. R.; Siervo, A. de; Weier, D.; Schürmann, M.; Berges, U.; Dreiner, S.; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.; Westphal, C.-Artigo
2007The effect of alloying on shake-up satellites: the case of Pd in SbPd2 and InPd2 surface alloysPancotti, A.; Siervo, A. de; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.-Artigo
2011Ordered oxide surfaces on metals: chromium oxidePancotti, Alexandre; Siervo, Abner de; Carazzolle, Marcelo F.; Landers, Richard; Kleiman, George G.-Artigo
2011Characterization of ultra-thin films of Pd deposited on Au(111)Pancotti, A.; Nascente, P. A. P.; Siervo, A. de; Landers, R.; Carazzolle, M. F.; Tallarico, D. A.; Kleiman, G. G.-Artigo
2008Structure determination of three-dimensional hafnium silicide nano structures on Si(100) by means of X-ray photoelectron diffractionFlüchter, C. R.; Siervo, A. de; Weier, D.; Schürmann, M.; Beimborn, A.; Dreiner, S.; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.; Westphal, C.-Artigo
2011Surface structure determination of Pd on W(100) using X-ray photoelectron diffractionLussani, F. C.; Siervo, A. de; Figueiredo, J. J. S. de; Pancotti, A.; Landers, R.-Artigo
2016Surface structure determination of black phosphorus using photoelectron diffractionLima, Luis Henrique de; Barreto, Lucas; Landers, Richard; Siervo, Abner de-Artigo