Browsing by Author Weiera, D.
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| Preview | Issue Date | Title | Author(s) | Advisor | Type |
| 2006 | Photoelectron spectroscopy (XPS) and photoelectron diffraction (XPD) studies on the system hafnium silicide and hafnium oxide on Si(1 0 0) | Weiera, D.; Flüchtera, C.; Siervo, A. de; Schürmann, M.; Dreiner, S.; Berges, U.; Carazzolle, M. F.; Pancotti, A.; Landers, R.; Kleiman, G. G.; Westphal, C. | - | Artigo |
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