Browsing by Author Weier, D.

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PreviewIssue DateTitleAuthor(s)AdvisorType
2010Solving the thermal stability problem at the HfO2 /Si interface with previous N implantationCarazzolle, M. F.; Flüchter, C. R.; Siervo, A. de; Pancotti, A.; Weier, D.; Schürmann, M.; Westphal, C.; Landers, R.; Kleiman, G. G.-Artigo
2006Hafnium silicide formation on Si(100) upon annealingSiervo, A. de; Flüchter, C. R.; Weier, D.; Schürmann, M.; Dreiner, S.; Westphal, C.; Carazzolle, M. F.; Pancotti, A.; Landers, R.; Kleiman, G. G.-Artigo
2008Structure determination of three-dimensional hafnium silicide nano structures on Si(100) by means of X-ray photoelectron diffractionFlüchter, C. R.; Siervo, A. de; Weier, D.; Schürmann, M.; Beimborn, A.; Dreiner, S.; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.; Westphal, C.-Artigo
2007Photoelectron diffraction study and structure determination of ultrathin hafnium silicide layers on silicon(100) using Mg Kα radiation and synchrotron lightFlüchter, C. R.; Siervo, A. de; Weier, D.; Schürmann, M.; Berges, U.; Dreiner, S.; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.; Westphal, C.-Artigo
2006Structure analysis of the system hafnium/silicon(100) by means of X-ray photoelectron spectroscopy and X-ray photoelectron diffraction (XPD)Flüchter, C. R.; Siervo, A. de; Weier, D.; Schürmann, M.; Berges, U.; Dreiner, S.; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.; Westphal, C.-Artigo
2007Structural and electronic analysis of Hf on Si(1 1 1) surface studied by XPS, LEED and XPDCarazzolle, M. F.; Schurmann, M.; Fluchter, C. R.; Weier, D.; Berges, U.; Siervo, A. de; Landers, R.; Kleiman, G. G.; Westphal, C.-Artigo