Repositorio da Producao Cientifica e Intelectual da Unicamp: Browsing DSpace

Browsing by Author Berges, U.

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

or enter first few letters:

Showing results 1 to 4 of 4

Preview	Issue Date	Title	Author(s)	Advisor	Type
	2006	Photoelectron spectroscopy (XPS) and photoelectron diffraction (XPD) studies on the system hafnium silicide and hafnium oxide on Si(1 0 0)	Weiera, D.; Flüchtera, C.; Siervo, A. de; Schürmann, M.; Dreiner, S.; Berges, U.; Carazzolle, M. F.; Pancotti, A.; Landers, R.; Kleiman, G. G.; Westphal, C.	-	Artigo
	2006	Structure analysis of the system hafnium/silicon(100) by means of X-ray photoelectron spectroscopy and X-ray photoelectron diffraction (XPD)	Flüchter, C. R.; Siervo, A. de; Weier, D.; Schürmann, M.; Berges, U.; Dreiner, S.; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.; Westphal, C.	-	Artigo
	2007	Photoelectron diffraction study and structure determination of ultrathin hafnium silicide layers on silicon(100) using Mg Kα radiation and synchrotron light	Flüchter, C. R.; Siervo, A. de; Weier, D.; Schürmann, M.; Berges, U.; Dreiner, S.; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.; Westphal, C.	-	Artigo
	2007	Structural and electronic analysis of Hf on Si(1 1 1) surface studied by XPS, LEED and XPD	Carazzolle, M. F.; Schurmann, M.; Fluchter, C. R.; Weier, D.; Berges, U.; Siervo, A. de; Landers, R.; Kleiman, G. G.; Westphal, C.	-	Artigo

Showing results 1 to 4 of 4