Browsing by Author Siervo, A. de

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PreviewIssue DateTitleAuthor(s)AdvisorType
2018Surface characterization of NbO islands formed on Nb(100) by X-Ray photoelectron diffractionPancotti, A.; Wang, J.; Rezende, A. C. S. A.; Santos, D. P.; Siervo, A. de; Landers, R.; Nascente, P. A. P.-Artigo
2019Surface structure characterization by X-ray photoelectron diffraction of Sn ultra-thin films deposited on Pd(111)Pancotti, A.; Siervo, A. de; Carazzolle, M. F.; Silva, J. J.; Nascente, P. A. P.; Landers, R.-Artigo
2001Electronic structure of LixNiOy thin filmsUrbano, A.; Castro, S. C. de; Landers, R.; Morais, J.; Siervo, A. de; Gorenstein, A.; Tabacniks, M. H.; Fantini, M. C. A.-Artigo
2006Photoelectron spectroscopy (XPS) and photoelectron diffraction (XPD) studies on the system hafnium silicide and hafnium oxide on Si(1 0 0)Weiera, D.; Flüchtera, C.; Siervo, A. de; Schürmann, M.; Dreiner, S.; Berges, U.; Carazzolle, M. F.; Pancotti, A.; Landers, R.; Kleiman, G. G.; Westphal, C.-Artigo
2006Structure analysis of the system hafnium/silicon(100) by means of X-ray photoelectron spectroscopy and X-ray photoelectron diffraction (XPD)Flüchter, C. R.; Siervo, A. de; Weier, D.; Schürmann, M.; Berges, U.; Dreiner, S.; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.; Westphal, C.-Artigo
2007Photoelectron diffraction study and structure determination of ultrathin hafnium silicide layers on silicon(100) using Mg Kα radiation and synchrotron lightFlüchter, C. R.; Siervo, A. de; Weier, D.; Schürmann, M.; Berges, U.; Dreiner, S.; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.; Westphal, C.-Artigo
2007Pd ultrathin film growth on C(0001): does it show magnetic behavior?Biasi, E. de; Siervo, A. de; Garcia, F.; Vicentin, F.; Landers, R.; Knobel, M.-Artigo
1999Photon energy and core hole lifetime dependences of Ag high energy Auger satellitesMorais, J.; Siervo, A. de; Landers, R.; Castro, S. G. C. de; Kleiman, G. G.-Artigo
2004XPS and XAES study of Ag–Pd and Cu–Ni alloys: spectra, shifts and electronic structure informationBarbieri, P. F.; Siervo, A. de; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.-Artigo
2002Electronic structure of Sr2FeMoO6Moreno, M. S.; Gayone, J. E.; Abbate, M.; Caneiro, A.; Niebieskikwiat, D.; Sánchez, R. D.; Siervo, A. de; Landers, R.; Zampieri, G.-Artigo
2005Photoelectron diffraction studies of Cu on Pd(111) random surface alloysSiervo, A. de; Soares, E. A.; Landers, R.; Kleiman, G. G.-Artigo
2004Pd growth on Cu(111): stress relaxation through surface alloying?Paniago, R.; Siervo, A. de; Soares, E. A.; Pfannes, H.-D.; Landers, R.-Artigo
2002Photoelectron diffraction from random surface alloys: critique of calculational methodsSoares, E. A.; Siervo, A. de; Landers, R.; Kleiman, G. G.-Artigo
2002Pd on Cu(111) studied by photoelectron diffractionSiervo, A. de; Soares, E. A.; Landers, R.; Fazan, T. A.; Morais, J.; Kleiman, G. G.-Artigo
2007The effect of alloying on shake-up satellites: the case of Pd in SbPd2 and InPd2 surface alloysPancotti, A.; Siervo, A. de; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.-Artigo
2007Structural and electronic analysis of Hf on Si(1 1 1) surface studied by XPS, LEED and XPDCarazzolle, M. F.; Schurmann, M.; Fluchter, C. R.; Weier, D.; Berges, U.; Siervo, A. de; Landers, R.; Kleiman, G. G.; Westphal, C.-Artigo
2007Surface composition and structure of nickel ultra-thin films deposited on Pd(111)Carazzolle, M. F.; Maluf, S. S.; Siervo, A. de; Nascente, P. A. P.; Landers, R.; Kleiman, G. G.-Artigo
2010Theoretical study of the heteroepitaxial growth of Pd on Cu(111), Pd on Ni(111), Ni on Pd(111), and Cu on Pd(111) using a semiempirical methodNegreiros, F. R.; Soares, E. A.; Siervo, A. de; Paniago, R.; Carvalho, V. E. de; Landers, R.-Artigo
2007Surface structure determination of Pd ultrathin films on Ru(0001): possible magnetic behaviorSiervo, A. de; Biasi, E. de; Garcia, F.; Landers, R.; Martins, M. D.; Macedo, W. A. A.-Artigo
2011Surface structure determination of Pd on W(100) using X-ray photoelectron diffractionLussani, F. C.; Siervo, A. de; Figueiredo, J. J. S. de; Pancotti, A.; Landers, R.-Artigo