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Browsing by Author Dreiner, S.

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Preview	Issue Date	Title	Author(s)	Advisor	Type
	2008	Structure determination of three-dimensional hafnium silicide nano structures on Si(100) by means of X-ray photoelectron diffraction	Flüchter, C. R.; Siervo, A. de; Weier, D.; Schürmann, M.; Beimborn, A.; Dreiner, S.; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.; Westphal, C.	-	Artigo
	2006	Hafnium silicide formation on Si(100) upon annealing	Siervo, A. de; Flüchter, C. R.; Weier, D.; Schürmann, M.; Dreiner, S.; Westphal, C.; Carazzolle, M. F.; Pancotti, A.; Landers, R.; Kleiman, G. G.	-	Artigo
	2006	Photoelectron spectroscopy (XPS) and photoelectron diffraction (XPD) studies on the system hafnium silicide and hafnium oxide on Si(1 0 0)	Weiera, D.; Flüchtera, C.; Siervo, A. de; Schürmann, M.; Dreiner, S.; Berges, U.; Carazzolle, M. F.; Pancotti, A.; Landers, R.; Kleiman, G. G.; Westphal, C.	-	Artigo
	2006	Structure analysis of the system hafnium/silicon(100) by means of X-ray photoelectron spectroscopy and X-ray photoelectron diffraction (XPD)	Flüchter, C. R.; Siervo, A. de; Weier, D.; Schürmann, M.; Berges, U.; Dreiner, S.; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.; Westphal, C.	-	Artigo
	2007	Photoelectron diffraction study and structure determination of ultrathin hafnium silicide layers on silicon(100) using Mg Kα radiation and synchrotron light	Flüchter, C. R.; Siervo, A. de; Weier, D.; Schürmann, M.; Berges, U.; Dreiner, S.; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.; Westphal, C.	-	Artigo

Showing results 1 to 5 of 5