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|Type:||Artigo de evento|
|Title:||Growth And Characterization Of Optical Grade Synthetic Quartz|
|Author:||Suzuki Carlos K.|
Tanaka Marcos S.
Shinohara Armando H.
|Abstract:||A method to position the seed and Z-region of growth out of the circulating micro-particle flux in commercial autoclave has been used to grow optical grade synthetic quartz. The number of solid inclusions is in the range of 0.02 - 0.03 particles/cm3, depending on the bar. The observation of X-ray topographic contrast of (0003) reflection shows a much smaller Z-region lattice spacing (strain) in comparison with the seed. The dislocation lines are in their totality originated by the seed etch-channels, that means, they can be eliminated by using a better quality seed.|
|Editor:||IEEE, Piscataway, NJ, United States|
|Citation:||Proceedings Of The Annual Ieee International Frequency Control Symposium. Ieee, Piscataway, Nj, United States, v. , n. , p. 78 - 83, 1996.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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